Thomas Campbell Bagg

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Thomas Campbell Bagg, Jr, (1917-1995) was an American specialist in high density information storage and retrieval.

Life

Thomas Campbell Bagg, Jr, was born October 28, 1917 in Philadelphia. He graduated from Lafayette College in Easton, Pennsylvania. He worked as Laboratory Instructor, University of Pennsylvania, 1939-1941, then as Junior Physicist, at the Carnegie Institute, Washington 1941.

Bagg worked at the National Bureau of Standards (renamed National Institute of Standards and Technology (NIST) in 1988) as a physicist working on Electronic Ord, 1941-1952; then on infrared and ultraviolet source detectors, 1952-1956. He was also a systems engineer and consultant on high density information storage.

He was responsible for operating the microfilm rapid selector at the US Navy Bureau of Ships. He died April 1, 1995 in Bethesda, Maryland.

Contributions

specialist in high density information storage and retrieval systems using photoptical techniques and associated image quality and standards.

• High density information storage and retrieval systems

Publications

• The rapid selector development program at the National Bureau of Standards. Gaithersburg, MD: National Bureau of Standards. NBS RPT 6243. 1958.
• "Continuous measurement of atmospheric ozone by an automatic photoelectric method." With R. Stair & R. G. Johnston. Journal of Research of the National Bureau of Standards 52, no 3 (March 1954): 133-139. Research Paper 2481. [1]
• "Spectral distribution of energy from the sun." With Ralph Stair & R. G. Johnston. Journal of Research of the National Bureau of Standards 53, no 2 (Aug 1952): 113-119. [2]

Offices

• International Organization for Standardization (ISO). US representative.

Honors

• US Department of Commerce. Bronze Medal.
• Association of Information and Image Management. Award of Merit, 1988.

Further reading

• Obituary. Washington Post [3]

Papers

LOCATION #1: NIST (Gaithersburg, MD)

• INCLUDES: Documents and publications relating to Bagg's work done at the National Bureau of Standards.

• SOURCE: Correspondence with Shukri Wakid, 6/97.

LOCATION #2: Special Collections Library, University of Michigan (Ann Arbor, MI)

• INCLUDES: Documents dealing with standards and the evolution of micrographics.
• SOURCE: Correspondence with Shukri Wakid, 6/97.

LOCATION #3: Charles Babbage Institute, University of Minnesota (Minneapolis, MN)

• INCLUDES: Documents dealing with the development of scanning equipment.
• SOURCE: Correspondence with Shukri Wakid, 6/97.

LOCATION #4: Association for Information and Image Management (Silver Spring, MD)

• INCLUDES: Documents dealing with the activities of standards committees and subcommittees.
• SOURCE: Correspondence with Shukri Wakid, 6/97.